SYMP - Roles of Metrology & Standardization in Nanotechnology, Singapore Dec 3 2007

Posted by:

Ai Lin Chun (group admin)

Date:

30 October 2007

Comments:

1 comment

A FREE one day symposium on the trend of world nanotechnology market, advances in nanotechnology and nanometrology worldwide and current efforts on standardisation by ISO, IEC and IEEE. Impact of nanotechnology products such as nanoparticles on the environment, human health and safety will also be addressed.

Lunch provided but must register by Nov 16 2007

Register here

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