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Grain Growth, Shape and Topology in all Dimensions: Beyond von Neumann-Mullins

Hosted by:
Dept. of Materials Science and Engineering, Center for Materials Science & Engineering, Materials Processing Center
Speaker:
David Srolovitz, Dean of Yeshiva College, Yeshiva University
Starts:
May 09, 2008 at 12:00 pm
Ends:
May 09, 2008 at 01:00 pm
Location:
MIT, Building 66, Room 120, 77 Massachusetts Ave., Cambridge, MA. 02139
Maps:

Description

Cellular microstructures are ubiquitous in nature. They can be found in polycrystalline microstructures, foams, plant epidermis, ferroelectrics, complex fluids, and even in ice cream.

In many situations, the cell/grain/bubble walls move to reduce their surface area (a surface tension effect), with a velocity proportional to the wall’s mean curvature. As a result, the cells evolve and coarsen.

Using this relation, and little else, von Neumann gave an exact formula for the growth rate of a cell in a 2-d cellular structure, which is the basis of modern grain growth theory. Borrowing ideas from geometric probability, we present an exact solution for the same problem in 3-d using the “mean width.” We then describe why the mean width is the natural linear measure of grain size and topology and is useful across broad swaths of the sciences. Next, we extend this 50 year old theory into all d≥2. Finally, we discuss using these ideas to more efficiently simulate grain growth.

Registration required:
No
Free:
Yes

For more information

Contact person:
Dept. of Materials Science and Engineering
Email:
Website:
Grain Growth, Shape and Topology in all Dimensions: Beyond von Neumann-Mullins
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